8- Detecting microstructural change at (fatigue) crack tips.


Advisor: A. Rolett, MSE.

This project will involve taking as many different kinds of image of the material near the tip of a crack as feasible. Specimens with different crack histories will be used with the aim of detecting the mechanical differences in the images. Imaging methods could include optical (both regular bright field and differential interference contrast), scanning electron microscopy (secondary, back scatter, EBSD), ion imaging (in the dual beam FIB).

 

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