Advisor: R. Suter, Physics Department
X-ray Diffraction Microscopy (XDM) is a new measurement
technique that allows to study of the internal
microstructure of polycrystals. Because it is non-destructive,
we can watch microstructures respond to stimuli
such as heat or strain. Measurements are done at
the Advanced Photon Source, a synchrotron located
at Argonne National Laboratory near Chicago. Data
analysis, based at CMU, requires extensive computational
work on large computer clusters. The resultant
three dimensional data sets contain information
about crystallite orientations, locations, shapes,
and internal defect distributions.
This project will involve using existing and,
perhaps developing new, methods to extract information
from three dimensional XDM datasets. Of particular
interest will be the specification of changes in
structural parameters from one data set to the
next. The work will involve using Matlab for analysis
and visualization. The student need not be an expert
with Matlab initially, but should be willing to
learn. |
