Investigation of surface microstructure of nanostructured films

To achieve stable operating conditions, long equipment life, high efficiency, and low pollution levels during the operation of turbine combustion systems, the in-situ measurement of the composition of natural gas or syngas is required. The Davis group has developed SiC metal-insulator-semiconductor field effect transistors and AlGaN/GaN high-electron-moblilty transistors as sensors of the components of natural gas prior to combustion. The REU students involved in this program will be trained to (1) operate state-of-the-art chemical vapor deposition systems for the growth of the SiC- and AlGaN/GaN-based films that compose the material device structures and (2) use atomic force and scanning electron microscopies to determine the surface microstructures of the surfaces of the substrates and the subsequently grown films that compose the MISFET and HEMT devices.

 

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